The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Jul. 02, 2014
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Jagan Sankaranarayanan, Santa Clara, CA (US);

Vahit Hacigumus, San Jose, CA (US);

Jeffrey LeFevre, Santa Cruz, CA (US);

Junichi Tatemura, Cupertino, CA (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30457 (2013.01); G06F 17/30339 (2013.01); G06F 17/30383 (2013.01); G06F 17/30598 (2013.01);
Abstract

A system includes first and second data stores, each store having a set of materialized views of the base data and the views comprise a multistore physical design; an execution layer coupled to the data stores; a query optimizer coupled to the execution layer; and a tuner coupled to the query optimizer and the execution layer, wherein the tuner determines a placement of the materialized views across the stores to improve workload performance upon considering each store's view storage budget and a transfer budget when moving views across the stores.


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