The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

May. 16, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hideki Takano, Kawasaki, JP;

Tsuneo Sobue, Tokyo, JP;

Shunichiro Furuhata, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3684 (2013.01); G06F 11/3696 (2013.01);
Abstract

An example of the invention is a test support system for supporting testing of a function of a program that works depending on a position of a mobile object in map information. A storage device holds event generation requirements information defining requirements for generation of an event in the program. The requirements specify a position designated in the map information and requirements on movement of the mobile object with respect to the designated position. A processor creates a plurality of test cases to be referred to in creating test data to be input to the program for checking whether the event is generated in accordance with the requirements with reference to the map information and the requirements. Each of the plurality of test cases specifies the designated position in the map information and movement of the mobile object with respect to the designated position.


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