The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Dec. 20, 2012
Microsoft Corporation, Redmond, WA (US);
Arjun Bijanki, Kirkland, WA (US);
Sandeep Agarwal, Redmond, WA (US);
Curtis Man, Seattle, WA (US);
Louis Lafreniere, Seattle, WA (US);
Ritesh Parikh, Redmond, WA (US);
Sankar Sundaram, Bellevue, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Systems, methods and computer program products are described herein for testing a system that is designed to optimize the execution of code within an application or other computer program based on profile data collected during the execution of such code. The embodiments described herein utilize what is referred to as a 'profile data mutator' to mutate or modify the profile data between the point when it is collected and the point when it is used to apply an optimization. By mutating the profile data at this point, testing of a system for optimized code execution can be significantly more thorough. Furthermore, such profile data mutation leads to a more scalable and efficient testing technique for profile-guided systems for optimized code execution.