The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Mar. 06, 2013
International Business Machines Corporation, Armonk, NY (US);
Marc A. Baumbach, Apex, NC (US);
Patrick J. Danford, Morrisville, NC (US);
George P. DeCandio, Cary, NC (US);
Christian Funkhouser, New York, NY (US);
David K. Grotjohn, Cary, NC (US);
Vishwanath Ramaswamy, Carlsbad Springs, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, computer program product, and computer system for generating, at a computing device, a first suspect profile of a plurality of suspect profiles that includes one or more characteristics, wherein the first suspect profile is associated with a traceability link between at least two artifacts. A change to a first characteristic associated with a first artifact of the at least two artifacts is determined. Which of the plurality of suspect profiles includes the first characteristic is determined. The first characteristic is matched to the first suspect profile of the plurality of suspect profiles based upon, at least in part, determining that the first suspect profile includes the first characteristic. The traceability link is marked as suspect based upon, at least in part, matching the first characteristic to the first suspect profile.