The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Dec. 02, 2015
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Kazuo Morita, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/22 (2006.01); G02B 21/00 (2006.01); G02B 21/02 (2006.01); A61B 19/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0012 (2013.01); A61B 19/5212 (2013.01); A61B 19/5223 (2013.01); A61B 90/361 (2016.02); G02B 21/02 (2013.01); G02B 21/22 (2013.01);
Abstract

Surgical observation system for observing, in three dimensions, a surgical site from two directions are provided herein. The surgical observation system may include a first image-acquisition optical system that obtains, from a first observation direction, a pair of optical images, having parallax, of a subject via a pair of apertures disposed side-by-side; and a second image-acquisition optical system that obtains, from a second observation direction in which an angle about an optical axis differs from that of the first observation direction, another pair of optical images, having parallax, of a subject via another pair of apertures disposed side-by-side.


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