The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Nov. 17, 2015
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/14 (2010.01); G01Q 60/56 (2010.01); G01Q 10/00 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/56 (2013.01); G01Q 10/00 (2013.01); G01Q 70/14 (2013.01);
Abstract
The invention is notably directed to a scanning probe sensor for a scanning probe microscope. The scanning probe sensor comprises a probe tip having a ferromagnetic fluid and a magnetic field generator adapted to generate a magnetic field acting on the ferromagnetic fluid. Furthermore, a sensor controller is provided and configured to control one or more parameters of the magnetic field generator, thereby controlling the shape of the fluid. The invention further concerns a related scanning probe sensor, a related method and a related computer program product.