The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Jan. 04, 2013
Applicant:

Bend Research, Inc., Bend, OR (US);

Inventors:

Brandon J. Downey, Bend, OR (US);

Jeffery F. Breit, Bend, OR (US);

Lisa Graham, Bend, OR (US);

Adam S. Carroll, Bend, OR (US);

Assignee:

Bend Research, Inc., Bend, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/22 (2006.01); C12M 1/34 (2006.01); G01N 33/483 (2006.01);
U.S. Cl.
CPC ...
G01N 27/22 (2013.01); C12M 41/36 (2013.01); C12M 41/46 (2013.01); G01N 27/221 (2013.01); G01N 33/4833 (2013.01);
Abstract

Methods and apparatus are disclosed for correcting measurements received by applying a frequency-varying signal with a measuring device (e.g., a permittivity probe) to a population of living cells (e.g., contained in a bioreactor) and correcting measurement divergences using data acquired using an alternate analytical method (e.g., trypan blue exclusion). In one example, a method comprises receiving electrical property data for a first population of cells, the data obtained by applying a first frequency-varying signal to the population with a measuring device, receiving biological property data obtained using an alternate analytical technique, generating at least one value representative of the frequency dependence of the electrical property data, and determining a relationship between the biological property data and the representative value. In some examples, measurements of apoptosis are predicted using the electrical property data.


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