The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Oct. 15, 2013
Board of Trustees of Michigan State University, East Lansing, MI (US);
Dharmendra K. Mishra, East Lansing, MI (US);
Kirk D. Dolan, East Lansing, MI (US);
James V. Beck, East Lansing, MI (US);
BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY, East Lansing, MI (US);
Abstract
A testing system for use in measuring thermal properties of material is described herein. The testing system includes a testing apparatus and monitoring system coupled to the testing apparatus. The testing apparatus includes a housing assembly that is configured to receive a material. A heating assembly is coupled to the housing assembly to supply a heat to at least a portion of the material to increase the temperature of the material. A sensing assembly is coupled to the housing assembly and is configured to sense a temperature of the material. The monitoring system comprises a controller having a processor comprising computer-readable instructions for operating the heating assembly to apply a heat to the material volume, receiving signals from the sensing assembly indicative of a temperature of the material, and estimating at least one thermal property of the material utilizing the sensed temperature of the material volume.