The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Nov. 08, 2013
Samsung Electronics Co., Ltd., Suwon-si, KR;
Industry-academic Cooperation Foundation, Yonsei University, Seoul, KR;
Soo-Chul Lim, Seoul, KR;
Jong Baeg Kim, Goyang-si, KR;
Joon Ah Park, Seoul, KR;
Soon Jae Pyo, Chungju-si, KR;
Min Ook Kim, Daejeon, KR;
Jae Ik Lee, Goyang-si, KR;
Tae Young Chung, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Industry-Academic Cooperation Foundation, Yonsei University, Seoul, KR;
Abstract
An apparatus and method for measuring a tactile information, using a material having variable pressure dependent properties is disclosed. The apparatus for measuring the tactile information may include a plurality of pressure measurement units to measure a magnitude of an external pressure using a material having variable properties, and a tactile information measurement unit to measure a three-dimensional (3D) tactile information based on the external pressure using a location of the plurality of pressure measurement units and a pressure measured by the plurality of pressure measurement units.