The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Aug. 01, 2013
Tadashi Nakamura, Tokyo, JP;
Shigeaki Imai, Kanagawa, JP;
Tadashi Nakamura, Tokyo, JP;
Shigeaki Imai, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
Disclosed is an optical measurement device including a first light source, an optical element that condenses a light beam emitted from the first light source, a light irradiator that irradiates the light beam onto an object; and a photo detector that detects reflected light or scattered light of the light beam from the object through an imaging system, the light beam being irradiated onto the object, wherein a first optical path length from the first light source to a first conjugate image of the first light source by the optical element is different from a second optical path length from the photo detector to a second conjugate image of the photo detector by the imaging system at least in a first direction.