The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Mar. 15, 2014
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
David M. S. Johnson, Somerville, MA (US);
David L. Butts, Boston, MA (US);
Richard E. Stoner, Framingham, MA (US);
THE CHARLES STARK DRAPER LABORATORY, INC., Cambridge, MA (US);
Abstract
Compact inertial measurement systems and methods based on atom interferometry. Certain examples provide a combination atomic accelerometer-gyroscope configured to recapture and cycle atom samples through atom interferometers arranged to allow the next measurement to use the atoms from the previous measurement. Examples of the apparatus provide inertial measurements indicative of rotation for different inertial axes by applying atom interferometry to a plurality of atom samples launched in opposite directions to allow for measurement of both acceleration and rotation rates. In some examples, the inertial measurement apparatus provide a combined atomic gyroscope and an atomic accelerometer in a compact six Degrees of Freedom (6 DOF) IMU.