The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2017
Filed:
Sep. 10, 2012
Yoichi Toriumi, Tokyo, JP;
Hideo Kawabe, Saitama, JP;
Kenichi Kabasawa, Saitama, JP;
Tatsuya Suzuki, Kanagawa, JP;
Hirokazu Imai, Chiba, JP;
Masatoshi Ueno, Kanagawa, JP;
Yoichi Toriumi, Tokyo, JP;
Hideo Kawabe, Saitama, JP;
Kenichi Kabasawa, Saitama, JP;
Tatsuya Suzuki, Kanagawa, JP;
Hirokazu Imai, Chiba, JP;
Masatoshi Ueno, Kanagawa, JP;
Sony Corporation, , JP;
Abstract
There is provided a measuring apparatus, including a light receiving element, provided at a position facing a measurement object region on which is placed a measurement object, which forms an image with light from the measurement object region, light emitting elements, arranged surrounding the light receiving element, which emit light for measuring the measurement object, and reflective optical elements, provided above the light emitting elements, which guide, to the measurement object region, emission light radiated from the light emitting elements. A light receiving surface of the light receiving element and light emission surfaces of the light emitting elements are positioned mutually on a same plane. The emission light radiated from the light emitting elements is reflected by the reflective optical elements, and center lines of the emission light radiated from each of the light emitting elements pass through an approximate center of the measurement object region.