The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2017

Filed:

Jan. 22, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yasuhiro Nakahara, Kawasaki, JP;

Shigeaki Ono, Tokyo, JP;

Yukio Sakagawa, Tokyo, JP;

Hiroki Uchida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01); G06T 7/00 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30041 (2013.01);
Abstract

To ensure display of a region of interest on a fundus image and a tomographic image of an eye to be inspected in a correspondence manner, an apparatus for processing images of an eye to be inspected includes: a unit that acquires a fundus image of an eye to be inspected; a unit that designates an arbitrary point on the fundus image; a unit that acquires a tomographic image of the eye to be inspected; a unit that calculates a point on the tomographic image corresponding to the arbitrary point; and a unit that converts a coordinate system for displaying the tomographic image and the fundus image in association with each other on the basis of positions of the arbitrary point and the corresponding point.


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