The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Apr. 24, 2012
Applicants:

Geoffrey C Mayne, San Diego, CA (US);

David Bradley Short, San Diego, CA (US);

Daniel Weinstein, San Diego, CA (US);

Dan Riedler, Los Angeles, CA (US);

Inventors:

Geoffrey C Mayne, San Diego, CA (US);

David Bradley Short, San Diego, CA (US);

Daniel Weinstein, San Diego, CA (US);

Dan Riedler, Los Angeles, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/14 (2006.01); H04N 7/15 (2006.01); G09G 3/00 (2006.01); H04N 5/262 (2006.01);
U.S. Cl.
CPC ...
H04N 7/15 (2013.01); G09G 3/001 (2013.01); H04N 5/2628 (2013.01); H04N 7/142 (2013.01); H04N 7/144 (2013.01); H04N 7/147 (2013.01);
Abstract

A system and a method for displaying an image are disclosed herein. The system includes a surface on which the image is displayed and a display rendering device to display the image on the surface. The system also includes a capture device to detect the surface, a processor, and a non-transitory computer-readable storage medium including instructions that cause the processor to: determine dimensions of the surface, determine a first orientation of the surface, convert the image to display on the surface based on the determined dimensions of the surface and the determined first orientation of the surface, detect repositioning of the surface to a second orientation, determine the second orientation of the surface, and convert the image to display on the surface based on the determined dimensions of the surface and the determined second orientation of the surface relative to the capture device.


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