The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Aug. 17, 2015
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Jason Hau-Ping Chen, Santa Clara, CA (US);

Brandon Dean Slack, Kitchener, CA (US);

David I. Simon, San Francisco, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23261 (2013.01); H04N 5/23248 (2013.01); H04N 5/23293 (2013.01);
Abstract

Methods and apparatuses are disclosed to correct for tilt and/or perspective distortion in image capture devices. In some embodiments, the method may include reading an orientation measurement associated with a relative position of an image capture device with respect to an object, determining if the orientation measurement is less than a threshold, and in the event that the orientation measurement is less than the threshold, correcting an image obtained by the image capture device. In some embodiments, the apparatus may include an image sensor, a memory coupled to the image sensor, an orientation measurement device coupled to the image sensor, and a distance measurement device coupled to the image sensor, where the image data may be stored in the memory along with a measurement from the accelerometer and along with a measurement from the distance measurement device.


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