The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Sep. 24, 2015
Apple Inc., Cupertino, CA (US);
Alexander Lindskog, Santa Clara, CA (US);
Frank Doepke, San Jose, CA (US);
Ralf Brunner, Cupertino, CA (US);
Thomas E. Bishop, San Francisco, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Generating a focus stack, including receiving initial focus data that identifies a plurality of target depths, positioning a lens at a first position to capture a first image at a first target depth of the plurality of target depths, determining, in response to capturing the first image and prior to capturing additional images, a sharpness metric for the first image, capturing, in response to determining that the sharpness metric for the first image is an unacceptable value, a second image at a second position based on the sharpness metric, wherein the second position is not included in the plurality of target depths, determining that a sharpness metric for the second image is an acceptable value, and generating a focus stack using the second image.