The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Apr. 11, 2014
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Dipti Ranjan Pal, San Diego, CA (US);

Paul Ivan Penzes, Irvine, CA (US);

Wai Kit Siu, San Diego, CA (US);

Assignee:

QUALCOMM INCORPORATED, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H03K 3/012 (2006.01); H03K 3/037 (2006.01); G11C 19/34 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
H03K 3/012 (2013.01); G01R 31/318536 (2013.01); G01R 31/318541 (2013.01); G11C 19/34 (2013.01); H03K 3/0375 (2013.01); G01R 31/318594 (2013.01);
Abstract

A first apparatus includes at least one scan chain. Each of the at least one scan chain includes scan cells coupled together. Each scan cell in the at least one scan chain includes a first type of scan cell when a reset state of the scan cell is a first state, and a second type of scan cell when the reset state of the scan cell is a second state. One or more scan chains of the at least one scan chain includes at least one of the first type of scan cell and at least one of the second type of scan cell. A second apparatus includes first and second sets of scan chains including flip-flops without both set and reset functionality. Each of the flip-flops in the first and second sets of scan chains has a reset state of a first state and a second state, respectively.


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