The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Feb. 12, 2014
International Business Machines Corporation, Armonk, NY (US);
Murray R. Cantor, Westwood, MA (US);
Evelyn Duesterwald, Pleasantville, NY (US);
Tamir Klinger, Brooklyn, NY (US);
Peter K. Malkin, Yorktown Heights, NY (US);
Paul M. Matchen, Bethel, CT (US);
Stanley M. Sutton, Briarcliff Manor, NY (US);
Peri L. Tarr, Briarcliff Manor, NY (US);
Mark N. Wegman, Ossining, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Historic and current development data associated with the project may be gathered. A catalog of patterns, each pattern associated with a data measure and an analysis routine capable of detecting the pattern according to the data measure in a given data set may be obtained. A pattern describes a particular indication in the historical and development data, which arises one or more of, at a discrete point in time or over a period of time. The analysis routine may be applied to the historic and current development data. A notification may be issued responsive to identifying the pattern in the historic and current development data. The applying and the issuing may be performed for each pattern in the catalog of patterns.