The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Jun. 21, 2016
Iteris, Inc., Santa Ana, CA (US);
Lori J. Wiles, Fort Collins, CO (US);
Dustin C. Balsley, Osage, IA (US);
ITERIS, INC., Santa Ana, CA (US);
Abstract
A pest and disease modeling framework for precision agriculture applies weather information, pest biological characteristics, and crop management data to anonymous crowd-sourced observations of pest presence for a reporting field. A risk assessment profile of pest occurrence for targeted fields in proximity to reporting fields is modeled to generate field-specific measures for pest management of pest infestation. The pest and disease modeling framework matches and filters weather and crop information in infested and pest-free fields based on the anonymous, crowd-sourced reporting of an existing pest presence, by evaluating similarities in pest-relevant data. Fields that are similar to infested fields have the highest risk of infestation, and the modeling framework provides output data in the form of a prediction of pest occurrence based on the risk assessment profile.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile