The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Jul. 06, 2016
Applicant:
Agrian, Inc., Fresno, CA (US);
Inventor:
Aaron Dale Hunt, Bellefonte, PA (US);
Assignee:
AGRIAN, INC., Fresno, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 5/045 (2013.01); G06N 7/005 (2013.01);
Abstract
A multi-year yield analysis in precision agriculture characterizes variables affecting crop yield to enable site-specific prescription mapping for a bounded field for one or more crops in the field. The multi-year yield analysis enables recommendations for variable-rate applications to the bounded field such as seeding, fertilizing, tilling, and applying crop treatments. The multi-year yield analysis evaluates each of coverage data, uniformity data, age data, and weather data related to crop yield in the bounded field.