The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Aug. 12, 2014
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Daniel L. Osiecki, Seattle, WA (US);

Prashant L. Sarma, Redmond, WA (US);

Monty Vanderbilt, Seattle, WA (US);

David R. Azari, Seattle, WA (US);

Caitlyn R. Schmidt, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 17/30 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/34 (2013.01); G06F 11/3006 (2013.01); G06F 11/3072 (2013.01); G06F 17/30533 (2013.01); H04L 43/02 (2013.01); H04L 43/04 (2013.01);
Abstract

Disclosed are various in various embodiments are systems and methods providing for storage of mass data such as metrics. A plurality of data models are generated in the server from a stream of metrics describing a state of a system. Each of the metrics is associated with one of a plurality of consecutive periods of time, and each data model represents the metrics associated with a corresponding one of the consecutive periods of time. The data models are stored in a data store and each of the metrics is discarded after use in generating at least one of the data models.


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