The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Oct. 04, 2016
Sharp Kabushiki Kaisha, Sakai, Osaka, JP;
Masayuki Miyamoto, Osaka, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
A capacitance detecting method disclosed herein, which achieves a good detection accuracy, a good resolution, and a high-speed operation, (A) (a) drives, on the basis of code sequences (di (=di1, di2, . . . , diN, where i=1, . . . , M)) which are orthogonal to one another and include ±1 and each of which has a length N, drive lines (DLthrough DLM) in parallel for each of (I) a first capacitance column (Ci1) between the drive lines and a first sense line (SL) and (II) a second capacitance column (Ci2) between the drive lines and a second sense line (SL) so that voltages ±V are applied and (b) outputs outputs (sFirst=(s, s, . . . , sN)) from the first capacitance column (Ci1) and outputs (sSecond=(s, s, . . . , sN)) from the second capacitance column (Ci2), and (B) estimates (a) on the basis of a first inner product operation of the outputs (sFirst) and the code sequences (di), a first capacitance value in the first capacitance column (Ci1) and (b) on the basis of a second inner product operation of the outputs (sSecond) and the code sequences (di), a second capacitance value in the second capacitance column (Ci2).