The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Mar. 15, 2013
Applicant:

3m Innovative Properties Company, St. Paul, MN (US);

Inventors:

Edward J. Kivel, Stillwater, MN (US);

Timothy J. Nevitt, Red Wing, MN (US);

Michael F. Weber, Shoreview, MN (US);

Assignee:

3M INNOVATIVE PROPERTIES COMPANY, Saint Paul, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/08 (2006.01); G02B 5/28 (2006.01); G02B 5/30 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
G02B 5/0841 (2013.01); G02B 5/281 (2013.01); G02B 5/285 (2013.01); G02B 5/287 (2013.01); G02B 5/305 (2013.01); G02B 5/3041 (2013.01); G02B 27/142 (2013.01);
Abstract

A broadband mirror, polarizer, or other reflector includes separate stacks of microlayers. Microlayers in each stack are arranged into optical repeat units, and the stacks are arranged in series. At a design angle of incidence such as normal incidence, the second stack provides a second 1order reflection band and a distinct second 2order reflection band with a second spectral pass band therebetween. The first stack provides a first 1order reflection band that fills the second spectral pass band such that a single wide reflection band is formed that includes the first 1order reflection band, the second 1order reflection band, and the second 2order reflection band. In some cases, the single wide reflection band can include a first 2order reflection band of the first stack. In some cases, the first and second stacks may have apodized portions which monotonically deviate from respective baseline portions.


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