The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Jul. 01, 2011
Applicants:

Anthony J. Peyton, Bolton, GB;

David W. Armitage, Malpas, GB;

Liam A. Marsh, Stockport, GB;

Christos Ktistis, Warrington, GB;

William Robert Breckon Lionheart, High Peak, GB;

Ari Järvi, Espoo, FI;

Inventors:

Anthony J. Peyton, Bolton, GB;

David W. Armitage, Malpas, GB;

Liam A. Marsh, Stockport, GB;

Christos Ktistis, Warrington, GB;

William Robert Breckon Lionheart, High Peak, GB;

Ari Järvi, Espoo, FI;

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G01V 3/12 (2006.01); G01V 3/10 (2006.01);
U.S. Cl.
CPC ...
G01V 3/12 (2013.01); G01V 3/105 (2013.01);
Abstract

The present application is a detection system for locating and characterizing an object placed in a detection area in a three dimensional space. The detection system includes a plurality of magnetic field generators and magnetic field detectors arranged on opposite sides of the detection area and a control system for enabling generation of a magnetic field in the detection area by the magnetic field generators and for measuring of the magnetic field modified by the object at each of the magnetic field detectors. The detection system also includes a processor for processing the measured magnetic field to obtain a data set characterizing the object and a location of the object. The processor applies a reconstruction process on a predefined number of measurements of the modified magnetic field.


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