The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Oct. 01, 2015
Applicant:
The Curators of the University of Missouri, Columbia, MO (US);
Inventors:
Gavin McLean King, Columbia, MO (US);
Krishna Prasad Sigdel, Columbia, MO (US);
Assignee:
The Curators of the University of Missouri, Columbia, MO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 20/02 (2010.01); G01Q 20/00 (2010.01); G01Q 60/24 (2010.01); G01Q 30/04 (2010.01); G01Q 60/34 (2010.01);
U.S. Cl.
CPC ...
G01Q 20/02 (2013.01); G01Q 20/00 (2013.01); G01Q 30/04 (2013.01); G01Q 60/24 (2013.01); G01Q 60/34 (2013.01);
Abstract
With example embodiments described herein, a probe tip of a scanning probe microscope (such as an atomic force microscope (AFM)) is directly detected as it moves in a tapping mode to determine the tip positions over time, and a force for the tip is computed from these determined tip positions.