The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Aug. 18, 2014
Applicant:

Charm Sciences, Inc., Lawrence, MA (US);

Inventors:

Steven J. Saul, Arlington, MA (US);

Robert J. Markovsky, Brentwood, NH (US);

David W. Douglas, Andover, MA (US);

Assignee:

Charm Sciences, Inc., Lawrence, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/558 (2006.01); G01N 33/544 (2006.01);
U.S. Cl.
CPC ...
G01N 33/544 (2013.01); G01N 33/558 (2013.01); G01N 2333/37 (2013.01);
Abstract

Embodiments described herein include methods and assays for detecting beta-lactam analytes and mycotoxin analytes in a sample. Some embodiments include detection of multiple analytes in a sample utilizing a plurality of analyte binders and a control zone containing multiple control zone capture agents. In some embodiments, the multiple control zone capture agents capture a plurality of binders within one control zone. Test results are determined by comparison of the control zone signal to a test zone signal.


Find Patent Forward Citations

Saul, Steven. (2017). Method and assay for detection of residues (U.S. Patent No. 9562898). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9562898

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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