The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Sep. 30, 2013
Fujifilm Corporation, Tokyo, JP;
Kazuyoshi Horii, Ashigarakami-gun, JP;
Junpei Shiraishi, Ashigarakami-gun, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
An analysis device for performing analysis about a substance by using an analysis chip having therein a reaction area that reacts with the substance is provided. The analysis device includes: a control section in contact with the analysis chip; a first sensor for measuring an ambient temperature of the analysis chip; a second sensor for measuring the temperature at a contact area of the control section in contact with the analysis chip, and a control circuit for performing feedback control of the control section by finding a temperature of the contact area for achieving a desired temperature of the reaction area based on the ambient temperature measured by the first sensor and a temperature gradient between a position at which the ambient temperature is measured and the reaction area, setting the found temperature as a target value and setting the temperature detected by the second sensor as an output value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile