The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Mar. 14, 2014
Paul E. Debevec, Culver City, CA (US);
Xueming Yu, Arcadia, CA (US);
Graham Leslie Fyffe, Los Angeles, CA (US);
Abhijeet Ghosh, London, GB;
Paul E. Debevec, Culver City, CA (US);
Xueming Yu, Arcadia, CA (US);
Graham Leslie Fyffe, Los Angeles, CA (US);
Abhijeet Ghosh, London, GB;
UNIVERSITY OF SOUTHERN CALIFORNIA, Los Angeles, CA (US);
Abstract
An apparatus to measure surface orientation maps of an object may include a light source that is configured to illuminate the object with a controllable field of illumination. One or more cameras may be configured to capture at least one image of the object. A processor may be configured to process the image(s) to extract the reflectance properties of the object including an albedo, a reflection vector, a roughness, and/or anisotropy parameters of a specular reflectance lobe associated with the object. The controllable field of illumination may include limited-order Spherical Harmonics (SH) and Fourier Series (FS) illumination patterns with substantially similar polarization. The SH and FS illumination patterns are used with different light sources.