The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Aug. 19, 2011
Shoji Tanigawa, Sakura, JP;
Itaru Ishida, Sakura, JP;
Shoichiro Matsuo, Sakura, JP;
Toshio Kurashima, Tsukuba, JP;
Kazuhide Nakajima, Tsukuba, JP;
Tomoya Shimizu, Tsukuba, JP;
Takashi Matsui, Tsukuba, JP;
Yukihiro Goto, Tsukuba, JP;
Shoji Tanigawa, Sakura, JP;
Itaru Ishida, Sakura, JP;
Shoichiro Matsuo, Sakura, JP;
Toshio Kurashima, Tsukuba, JP;
Kazuhide Nakajima, Tsukuba, JP;
Tomoya Shimizu, Tsukuba, JP;
Takashi Matsui, Tsukuba, JP;
Yukihiro Goto, Tsukuba, JP;
FUJIKURA LTD., Tokyo, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Abstract
A measuring method of a longitudinal distribution of bending loss of an optical fiber includes calculating an arithmetical mean value I(x) from two backscattering light intensities of two backscattering light at a position x obtained by bidirectional OTDR measurement of the optical fiber; and obtaining a bending loss value at the position x from a mode field diameter 2W(x) and a relative refractive index difference Δ(x) at the position x calculated from the arithmetical mean value.