The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Dec. 09, 2013
Applicant:
Yves-alain Peter, Terrebonne, CA;
Inventors:
Yves-Alain Peter, Terrebonne, CA;
Raphael St-Gelais, Montreal, CA;
Assignee:
POLYVALOR, LIMITED PARTNERSHIP, Montreal, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/26 (2006.01); G01N 21/45 (2006.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
G01J 3/26 (2013.01); G01N 21/45 (2013.01); G01N 2021/7723 (2013.01); G01N 2021/7779 (2013.01);
Abstract
There is described a deformable interferometric sensor in which polymer swelling, upon analyte absorption, is used to deform an on-chip silicon Fabry-Perot interferometer (FPI). The magnitude of the deformation, recorded through the resonance wavelength shift, is proportional to the analyte concentration.