The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Feb. 16, 2012
Applicants:

Sven Hollstein, Lower Saxony, DE;

Eduard Kirchmeier, Lower Saxony, DE;

Hans-juergen Faber, Niedersachsen, DE;

Christian Fulda, Lower Saxony, DE;

Inventors:

Sven Hollstein, Lower Saxony, DE;

Eduard Kirchmeier, Lower Saxony, DE;

Hans-Juergen Faber, Niedersachsen, DE;

Christian Fulda, Lower Saxony, DE;

Assignee:

BAKER HUGHES INCORPORATED, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/40 (2006.01); G01V 3/30 (2006.01); E21B 47/08 (2012.01); G01V 11/00 (2006.01);
U.S. Cl.
CPC ...
E21B 47/082 (2013.01); G01V 3/30 (2013.01); G01V 11/00 (2013.01); G01V 1/40 (2013.01);
Abstract

An apparatus for estimating a first property in a borehole penetrating the earth is described. The apparatus includes a carrier configured to be conveyed through the borehole. The apparatus also includes a first sensor disposed at the carrier and configured to perform a first measurement of the first property, the first sensor having a first direction of sensitivity; a second sensor disposed at the carrier and configured to perform a second measurement of a second property, the second sensor having a second direction of sensitivity; and a processor configured to receive the first and second measurements and to correct the first measurement using the second measurement in order to estimate the first property.


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