The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Jan. 14, 2014
Applicant:

Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;

Inventors:

Kazuaki Sasa, Ibaraki, JP;

Yusuke Yamamoto, Ibaraki, JP;

Hironobu Machinaga, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 15/08 (2006.01); C23C 14/08 (2006.01); C23C 14/58 (2006.01); C23C 14/35 (2006.01); H01L 31/18 (2006.01);
U.S. Cl.
CPC ...
C23C 14/086 (2013.01); C23C 14/35 (2013.01); C23C 14/5806 (2013.01); H01L 31/1884 (2013.01); Y02E 10/50 (2013.01);
Abstract

A transparent conductive film includes a transparent conductive coating provided on at least one surface of an organic polymer film substrate, wherein the transparent conductive coating is a crystalline coating of an indium-based complex oxide having a content of a tetravalent metal element oxide of 7 to 15% by weight calculated by the formula {(the amount of the tetravalent metal element oxide)/(the amount of the tetravalent metal element oxide+the amount of indium oxide)}=100(%), has a thickness in the range of more than 40 to 200 nm, a specific resistance of 1.2×10to 2.0×10Ω·cm, main X-ray diffraction peaks corresponding to (222) and (440) planes and has a ratio (I/I) of (440) peak intensity (I) to (222) peak intensity (I) of less than 0.3, and has an internal stress of 700 MPa or less as determined by an X-ray stress measurement method.


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