The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
Dec. 05, 2008
Semi Kim, Daejeon, KR;
Hee Young Kang, Daejeon, KR;
Myoung Suk Choi, Daejeon, KR;
Mi-ra Lee, Daejeon, KR;
Jin-san Yoo, Daejeon, KR;
Young Kyu Park, Gwangju, KR;
Semi Kim, Daejeon, KR;
Hee Young Kang, Daejeon, KR;
Myoung Suk Choi, Daejeon, KR;
Mi-Ra Lee, Daejeon, KR;
Jin-San Yoo, Daejeon, KR;
Young Kyu Park, Gwangju, KR;
Korea Research Institute of Bioscience & Biotechnology, Daejeon, KR;
Abstract
The present invention relates to a method for screening anticancer agent or SIP1/ZEB2 inhibitor using integrin alpha 5 (ITGA5), more precisely a method for measuring integrin alpha 5 expression pattern in SIP1/ZEB2 over-expressing cell line or SIP1/ZEB2 expression induced cell line, both treated with sample compounds, by comparing with that of the control. The method of the present invention facilitates screening of anticancer agent or SIP1/ZEB2 inhibitor simply by measuring integrin alpha 5 expression, so that it can be effectively applied in the field of medicine.