The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2017

Filed:

Dec. 01, 2014
Applicant:

Nidek Co., Ltd., Gamagori, Aichi, JP;

Inventors:

Hajimi Namiki, Aichi, JP;

Junpei Nishiyama, Aichi, JP;

Natsuru Misaki, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/0041 (2013.01); A61B 3/14 (2013.01);
Abstract

An optical tomographic image photographing apparatus for acquiring information on a tissue inside a specimen, the apparatus includes: a synthesis unit configured to generate a interference beam by synthesizing a measuring beam reflected from the tissue and a reference beam; and a detector configured to detect the generated first interference beam as a first interference signal, the first interference beam being detected for each scanning position of the measuring beam. The optical tomographic image photographing apparatus acquires tomographic information for each scanning position of the specimen by using the detected first interference signal and acquiring tomographic image data of the specimen expressed by polar coordinates by using the tomographic information; and converts the tomographic image data of the specimen expressed by the acquired polar coordinates into image data expressed by rectangular coordinates.


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