The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Oct. 16, 2015
Applicant:

Anritsu Company, Morgan Hill, CA (US);

Inventors:

Randy Lundquist, Shelley, ID (US);

Mark Heimbach, Morgan Hill, CA (US);

Eric Hakanson, Morgan Hill, CA (US);

Assignee:

ANRITSU COMPANY, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 24/08 (2009.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04L 27/2614 (2013.01);
Abstract

A method of estimating a location of an interference signal source includes using a first antenna configured to receive a signal from the interference signal source and using a second antenna arranged proximate to the first antenna and configured to receive global positioning system (GPS) signals. An initial trend in variation in power of a received signal from the interference signal source is determined relative to a position of the second antenna, wherein upon determining the initial trend, the initial trend is a current trend. In an iterative manner, the second antenna is directed to be repositioned and a current trend in the peak measurement in power is observed until an estimate of the location of the interference signal source is determined.


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