The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Mar. 12, 2014
Applicant:

Politecnico Di Torino, Turin (TO), IT;

Inventors:

Enrico Vezzetti, Salassa, IT;

Daniel Grivon, Montjovet, IT;

Rayant Kenneth Braul De Leon, Verres, IT;

Gilmar Estuardo Fuentes Bravo, Ivrea, IT;

Vincenzo Marino, Militello Rosmarino, IT;

Sandro Moos, Meana di Susa, IT;

Assignee:

S.I.SV.EL. S.P.A., None (TO), IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); H04N 13/00 (2006.01); G01B 21/20 (2006.01); G01S 17/42 (2006.01); G06F 3/0346 (2013.01); G01S 17/02 (2006.01); H04N 13/02 (2006.01); G01S 17/89 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0022 (2013.01); G01B 21/20 (2013.01); G01S 17/023 (2013.01); G01S 17/42 (2013.01); G06F 3/0346 (2013.01); H04N 13/0253 (2013.01); G01S 17/89 (2013.01);
Abstract

A device for three-dimensional scanning of an object includes a detector adapted to obtain orientation information of the device, optics adapted to obtain planar information about a position of the device in a first reference plane of the optics, and a processor adapted to acquire the orientation information and the planar information from the detector and from the optics, respectively, and to process such information in order to obtain an estimate of a position of the device on an axis substantially perpendicular to the first reference plane, for the purpose of obtaining a three-dimensional image of the object.


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