The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Jan. 03, 2008
Manfred Weiser, München, DE;
Rainer Lachner, München, DE;
Manfred Weiser, München, DE;
Rainer Lachner, München, DE;
Brainlab AG, Feldkirchen, DE;
Abstract
A system and method of determining a measure of accuracy of a registration mapping combining data indicative of spatial positions in a three-dimensional operating space and imaging data acquired with an imaging device located in a position and orientation in operating space is provided. A phantom is brought into a first pose, wherein the phantom is at least in partial view of the imaging device located in a second pose, the phantom comprising a marker assembly that can be imaged by the imaging device. Image data of the marker assembly of the phantom is acquired with the imaging device in the second pose. Imaged markers in the acquired image data of the marker assembly are located, and mapped markers are obtained by submitting spatial positions of the markers in the marker assembly of the phantom in the first pose to the registration mapping using the second pose as the imaging pose. A distance measure of the imaged markers and the mapped markers is determined as the measure of accuracy of the registration mapping.