The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

May. 03, 2013
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Brandon William Porter, Yarrow Point, WA (US);

Slavik Dimitrovich, Woodinville, WA (US);

Anton Vladilenovich Goldberg, Bellevue, WA (US);

Aram Grigoryan, Issaquah, WA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0876 (2013.01); G06F 11/3612 (2013.01); G06F 11/3624 (2013.01);
Abstract

Methods and systems for implementing test coverage measurement are disclosed. A first set of interactions among a set of production services are determined. The first set of interactions comprises a plurality of service requests between individual ones of the set of production services. A second set of interactions among a set of test services are determined. The second set of interactions comprises a plurality of service requests between individual ones of the set of test services. A test coverage metric is generated. The test coverage metric indicates an amount of the first set of interactions that are covered by the second set of interactions.


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