The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Feb. 10, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Aiko Kato, Machida, JP;

Yu Nishimura, Kawasaki, JP;

Hiroaki Naruse, Oita, JP;

Keita Torii, Yamato, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H01L 21/02 (2006.01); H01L 21/311 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14636 (2013.01); H01L 21/31116 (2013.01); H01L 21/31144 (2013.01); H01L 21/76808 (2013.01); H01L 27/1462 (2013.01); H01L 27/14612 (2013.01); H01L 27/14627 (2013.01); H01L 27/14632 (2013.01); H01L 27/14638 (2013.01); H01L 27/14687 (2013.01); H01L 21/76804 (2013.01); H01L 2221/1036 (2013.01);
Abstract

A semiconductor device manufacturing method includes a step of forming a hole reaching a first insulating layer over a first conductive member; a step of forming a trench reaching a second insulating layer and in communication with the hole; a step of forming an opening exposing the first conductive member in the hole; and a step of forming a second conductive member connected to the first conductive member by embedding a conductive material in the opening, the hole, and the trench. The trench is formed under an etching condition such that the etching rate with respect to the second insulating layer is lower than the etching rate with respect to the third insulating layer.


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