The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Jan. 11, 2016
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Makoto Ueki, Tokyo, JP;

Takashi Hase, Tokyo, JP;

Yoshihiro Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); G11C 13/00 (2006.01); H01L 27/24 (2006.01); H01L 45/00 (2006.01);
U.S. Cl.
CPC ...
G11C 13/0069 (2013.01); H01L 27/2436 (2013.01); H01L 27/2463 (2013.01); H01L 45/085 (2013.01); H01L 45/1233 (2013.01); H01L 45/146 (2013.01);
Abstract

To improve information retention resistance of a resistance change memory which requires high information retention resistance. On the assumption that a special data storage memory and a general-purpose data storage memory are distinguished from each other, a forming operation small in resistance rise rate is used for an information writing operation of the special data storage memory. A switching operation is used for information writing of the general-purpose data storage memory. That is, the special data storage memory is configured so as to store information while adapting an initial resistance state to '0' whereas adapting a low resistance state to '1'. On the other hand, the general-purpose data storage memory is configured so as to store information while adapting a high resistance state to “0” whereas adapting a low resistance state to “1”.


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