The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Jun. 26, 2012
Applicants:

Dmitry Anatolievich Koroteev, Moscow, RU;

Alexander Nikolaevich Nadeev, Spring, TX (US);

Ivan Viktorovich Yakimchuk, Moscow, RU;

Igor Andreevich Varfolomeev, Moscow, RU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 17/05 (2011.01); G01N 33/24 (2006.01); G01N 23/04 (2006.01); G06T 5/20 (2006.01); G06T 7/00 (2006.01); G06T 5/00 (2006.01); G06T 5/40 (2006.01);
U.S. Cl.
CPC ...
G06T 17/05 (2013.01); G01N 23/046 (2013.01); G01N 33/24 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 5/40 (2013.01); G06T 7/00 (2013.01); G06T 7/0081 (2013.01); G01N 2223/419 (2013.01); G01N 2223/616 (2013.01); G01N 2223/649 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20032 (2013.01); G06T 2207/20192 (2013.01); G06T 2207/30184 (2013.01);
Abstract

A method for building a 3D model of a rock sample comprises performing X-ray micro/nanoCT scanning of a rock sample and obtaining its initial three-dimensional microstructure image in a gray scale. Then, an analysis of the obtained three-dimensional image of the rock sample is performed and a binarization method is selected in dependence of the image quality and properties of the rock sample. The selected binarization method is at least once applied to the obtained initial three-dimensional image of the sample. Obtained 3D binarized image represents a 3D model of the rock sample.


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