The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Apr. 16, 2014
Applicant:

The Research Foundation, Albany, NY (US);

Inventors:

Jerome Z. Liang, Stony Brook, NY (US);

Jianhua Ma, Stony Brook, NY (US);

Hao Zhang, Stony Brook, NY (US);

William Moore, Setauket, NY (US);

Hao Han, Staten Island, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); A61B 6/5258 (2013.01); A61B 6/583 (2013.01); G06T 2211/424 (2013.01);
Abstract

Disclosed is a method for performing X-ray Computed Tomography scanning, the method including acquiring a plurality of images of an object, obtaining an initial image from the plurality of images, calculating NonLocal weight of the initial image, utilizing a current image estimation and registered prior image, performing a successive over-relaxation optimization to yield a new image estimation with an intensity of the new image estimation equal or greater than zero, performing a cycle update, generating an image of the object utilizing the new image estimation obtained from the optimization, and outputting a resultant image.


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