The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Dec. 21, 2015
International Business Machines Corporation, Armonk, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system, method and computer program product for determining an accuracy of a reconstructed image relative to a reference image. The method includes decomposing a reference image into a plurality of basis functions; reconstructing the image using the plurality of basis functions; determining differences between the reference image and reconstructed image; using statistical parametric mapping (SPM) to quantify existence of statistically significant regions of excursion in the determined differences; determining, based on the quantified regions of excursion, a minimum number of basis functions to reconstruct the image; and storing the determined number. The difference image is used as input to a univariate statistical test at every pixel to calculate an image of the test statistic which is then modeled as a multiGaussian random field. Quantities are calculated from the test statistic image for comparison to expected values to determine if the reconstructed image is an accurate representation of the reference image, or whether the number of basis functions used in the reconstruction is to be increased.