The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Jan. 22, 2014
International Business Machines Corporation, Armonk, NY (US);
Kathryn A. Bassin, Harpursville, NY (US);
Howard M. Hess, Winnetka, IL (US);
Sheng Huang, Shanghai, CN;
Steven Kagan, Burr Ridge, IL (US);
Shao C. Li, Beijing, CN;
Zhong J. Li, Beijing, CN;
He H. Liu, Beijing, CN;
Susan E. Skrabanek, Talking Rock, GA (US);
Hua F. Tan, Beijing, CN;
Jun Zhu, Beijing, CN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method is implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to receive one or more risk factors, receive one or more contexts, identify one or more context relationships and associate the one or more contexts with the one or more risk factors. Additionally, the programming instructions are operable to map the one or more risk factors for an associated context to a software defect related risk consequence to determine a risk model and execute a risk-based testing based on the risk model to determine a defect related risk evaluation for a software development project.