The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Nov. 26, 2014
Vmware, Inc., Palo Alto, CA (US);
Tariq Magdon-Ismail, San Jose, CA (US);
Duy Nguyen, Fremont, CA (US);
Brian James Martin, Campbell, CA (US);
Abha Jain, Sunnyvale, CA (US);
VMware, Inc., Palo Alto, CA (US);
Abstract
Exemplary methods, apparatuses, and systems receive a first input/output (I/O) trace from a first workload and run the first I/O trace through a cache simulation to determine a first miss ratio curve (MRC) for the first workload. A second I/O trace from the first workload is received and run through the cache simulation to determine a second MRC for the first workload. First and second cache sizes corresponding to a target miss rate for the first workload are determined using the first and second MRCs. A fingerprint of each of the first and I/O traces is generated. The first cache size, the second cache size, or a combination of the first and second cache sizes is selected as a cache size for the first workload based upon a comparison of the first and second fingerprints. A recommended cache size is generated based upon the selected cache size.