The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Dec. 19, 2013
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Samuel Leonard Moniz, Seattle, WA (US);

Keian Christopher, Seattle, WA (US);

Andrew Ross Evenson, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01);
Abstract

The techniques described herein provide software testing of a candidate software system. In some examples, a testing service compares at least one candidate response to at least a first control response to obtain one or more candidate test differences. The testing service may compare at least a second control response of the plurality of control responses to at least one of the first control response of the plurality of control responses or a third control response of the plurality of control responses to obtain one or more control test differences. The testing service may then analyze the one or more candidate test differences based on the one or more control test differences to generate an evaluation of whether one or more of the candidate test differences are due to differences between the candidate software system and the control software system that generated the first control response.


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