The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Aug. 13, 2012
Applicants:

Soundari Arunachalam, Bangalore, IN;

Balaji Gururao, Erode, IN;

Senthilkumar Dhanagopalan, Bangalore, IN;

John Samuel, Pathanamthitta, IN;

Matthew R. Schrier, Holland, PA (US);

Mithun Biswas, Jagdalpur, IN;

Inventors:

Soundari Arunachalam, Bangalore, IN;

Balaji Gururao, Erode, IN;

Senthilkumar Dhanagopalan, Bangalore, IN;

John Samuel, Pathanamthitta, IN;

Matthew R. Schrier, Holland, PA (US);

Mithun Biswas, Jagdalpur, IN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 19/0428 (2013.01); G05B 2219/14092 (2013.01); G05B 2219/23467 (2013.01); G05B 2219/25074 (2013.01); G05B 2219/25428 (2013.01); G05B 2219/31134 (2013.01); G05B 2219/33331 (2013.01);
Abstract

A method includes identifying device description files corresponding to first and second field devices associated with an industrial process control system. The method also includes comparing multiple field device characteristics of the first and second field devices using the device description files. The method further includes identifying any differences between the device characteristics of the first field device and the device characteristics of the second field device. In addition, the method includes determining a compatibility of the first and second field devices based on any identified differences. The field device characteristics can relate to field device attributes, field device function blocks, and function block parameters of the first and second field devices.


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