The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Jan. 08, 2015
Applicant:

Rapiscan Systems, Inc., Torrance, CA (US);

Inventors:

Joseph Bendahan, San Jose, CA (US);

Michael King, Mountain View, CA (US);

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 3/08 (2006.01); G01T 3/00 (2006.01);
U.S. Cl.
CPC ...
G01T 3/008 (2013.01);
Abstract

The present specification describes systems and methods for the simultaneous detection of radioactive materials such as neutrons, muons and gamma rays based on thin gap chamber technology. A thin-gap chamber (TGC) is disclosed having a thermal neutron absorber material, such asBC orBC, which interacts with neutrons to emit heavy particles. The heavy particles, in turn, interact with the gas present in chamber to produce ionization that is converted into a measurable signal. The TGC is embedded in a neutron moderating medium. The detector systems are fabricated from commercially available construction materials and are easy to manufacture at a reasonable cost when compared to conventional He-3 neutron detector systems.


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