The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Nov. 17, 2015
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Inventors:

Chikako Tokunaga, Yokohama Kanagawa, JP;

Kenichi Anzou, Kawasaki Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31724 (2013.01); G01R 31/3177 (2013.01);
Abstract

According to one embodiment, a semiconductor integrated circuit includes memories, comparison circuits, first registers and a BIST. The comparison circuits compare output values of the memories with expected values, respectively. The first registers store comparison result data in the comparison circuits, respectively. The BIST controls tests of the memories and generates the expected values. A relief data generator generates relief data indicating the presence of a defect of each of the memories and a failure position on the basis of the comparison result data stored in a second register in the BIST. A third registers store the relief data and are smaller in number than the memories. A judgment circuit outputs a relief impossible signal when the total number of the relief data is greater the number of the third registers.


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