The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Jun. 30, 2013
Applicant:
Sumco Corporation, Minato-ku, Tokyo, JP;
Inventors:
Toshiaki Sudo, Akita, JP;
Tadahiro Sato, Akita, JP;
Ken Kitahara, Akita, JP;
Masami Ohara, Akita, JP;
Assignee:
SUMCO CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/95 (2006.01); G01N 21/65 (2006.01); C30B 15/10 (2006.01); C30B 29/06 (2006.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01N 21/95 (2013.01); C30B 15/10 (2013.01); C30B 29/06 (2013.01); G01N 21/3563 (2013.01); G01N 21/65 (2013.01); G01N 2201/105 (2013.01); G01N 2201/12 (2013.01);
Abstract
An inspection method of vitreous silica crucibles includes: a measurement step of measuring an infrared absorption spectrum or a Raman shift of a measurement point on an inner surface of the vitreous silica crucible; a determining step of predicting whether or not a surface-defect region occurs at the measurement point based on an obtained spectrum to determine a quality of the vitreous silica crucible.